Micron Technology, Inc is looking for a candidate for the Automated Defect Classification (ADC) 2.0 project based in Muar, Malaysia. The role involves collaboration with various teams to improve defect detection accuracy using advanced machine learning techniques. Ideal candidates will be pursuing a degree in Metrology, Engineering, or related fields, and possess strong analytical skills.

The position offers an opportunity to engage in an innovative project that aims to optimize defect detection processes, ensuring high-quality standards in production.