As a key leader within the High Bandwidth Memory (HBM) Product Engineering Media Health team, you will spearhead and develop a high‑performing team that drives both intrinsic and extrinsic reliability test development and execution for Micron’s latest HBM products on DRAM, interface die, and stacked configurations. Your responsibilities include driving extrinsic DPM reduction (Time0 and field DPM) and leading the intrinsic reliability charter, along with an optimized manufacturing test flow to meet critical KPIs of quality, cost, and cycle time.