As a Senior/Staff Test Solutions Engineer (HBM Probe) at Micron, you will take full ownership of developing, debugging, and delivering wafer/cube probe test solutions for High Bandwidth Memory (HBM) devices across the product lifecycle—from new product introduction (NPI) through high‑volume manufacturing (HVM). You are expected to drive fast learning cycles during early silicon, ensure probe readiness for downstream processes, and deliver test solutions that meet aggressive targets on yield, quality, and cost.

• HBM Probe Test Development & Ownership: Own end‑to‑end development and delivery of wafer/cube probe test solutions for HBM devices; define and drive probe test plans, including coverage strategy, defect screening, and test time targets; develop, debug, and release ATE test programs with full accountability for quality and manufacturability; ensure test solutions are robust, scalable...