Reliability engineering, reliability evaluation, physics‑of‑failure study, and formal qualification of optoelectronic chips (III‑V, SiPho). Assessment/evaluation of semiconductor and optical component ageing characteristics, failure modes & associated risks. Customer interface on reliability documentation and reliability work based on solid knowledge of physics‑of‑failures. Working closely with design, process, product and quality teams to conduct root cause investigation and reliability analysis of field returns. Definition and implementation of optical component qualification programmes. Problem solving, test engineering, testing and statistical data analysis.
Reliability engineering, physics‑of‑failure study, and formal qualification of InP and SiP chips.